Publications

  1. "Diagnosis of phosphorus monolayer doping in silicon based on nanowire electrical characterisation", R. Duffy, A. Ricchio, R. Murphy, G. Maxwell, R. Murphy, G. Piaszenski, N. Petkov, A. Hydes, D. O'Connell, C. Lyons, N. Kennedy, B. Sheehan, M. Schmidt, F. Crupi, J. D. Holmes, P. K. Hurley, J. Connolly, C. Hatem, & B. Long, J. Appl. Phys. 123, 125701 (2018).